Xenon-Sapphire: New 16k line scan lenses from SCHNEIDER KREUZNACH

Xenon-Sapphire (PresseBox) (Bad Kreuznach, ) At VISION 2011 in Stuttgart, Schneider-Kreuznach is showing its new Xenon-Sapphire special lens. This lens series is designed for the highest requirements of web and surface inspections, and is the first choice for FPD and PCB inspection systems. These applications require line scan lenses with very high resolution in order to guarantee cost-efficient error detection in manufacturing and associated quality assurance processes. When using high resolution cameras, the lens is often the limiting factor in the full utilisation of the theoretically possible system performance. The Xenon-Sapphire lenses were specially developed for use with new 16k line scan sensors. In their optical magnification range, they fully exploit all the possibilities of the very latest sensor generation.

Designed especially for 16k line scan cameras, they have excellent optical and mechanical properties. The high resolution of the lenses makes full use of the sensor’s 3.5 ?m pixel size. Their excellent coating in the range from 400 to 1000 nm ensures optimal luminous efficacy. Precision mechanics and special mounting technology minimise loss of contrast due to manufacturing tolerances. To further improve contrast, the best azimuth can be set using the industrial-grade V78 interface. The aperture setting is lockable in order to ensure high imaging performance even in the presence of strong vibrations.

More information on these new Schneider-Kreuznach products is available from 8 to 11 November at VISION 2011 in Stuttgart, Hall 4, Stand 4D18. Or visit our website at www.schneiderkreuznach.com.

Kontakt

Jos. Schneider Optische Werke GmbH
Ringstraße 132
D-55543 Bad Kreuznach
Wolfgang Berger
Corporate Communications
Fabian Parusel
fishermen communications GmbH

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