New system solution for production tests with LEDs and LED wafers

Instrument Systems presents own current source for LEDs
LSM 350 basic module in bench enclosure (PresseBox) (Munich, ) The LSM 350 4-quadrant source and measure unit from Instrument Systems was specifically developed to meet the requirements for production testing of LEDs and LED wafers. High test speeds and the multichannel capability make the LSM 350 an attractive solution for supplying current or voltage to LEDs with low to medium power output. Combination with high-precision array spectrometers from Instrument Systems creates a complete solution for optical and electrical testing carried out on LEDs.

As a bipolar current and voltage source, the LSM 350 offers all functions necessary for testing LEDs fast. The automatic polarity test feature can be used for single and multi-chip LEDs. Dedicated measurement ranges permit particularly precise testing at low forward currents of 1 μA, and measurement of reverse currents in the nA range. The modular concept includes an option to measure breakdown voltages up to 40 V. Very short settling times reduce the test cycles by up to 40% compared to those of most standard current sources.

The LSM 350 is fully integrated in the LED Tester. This proven turnkey system with the high-precision array spectrometers in the CAS 140CT or CAS 120 series from Instrument Systems allows test routines to be set up with fully automated testing and binning of LEDs and for testing LED wafers. The associated software permits a large number of different functions and evaluation options.

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Instrument Systems Optische Messtechnik GmbH
Neumarkter Str. 83
D-81673 München
Melanie Sieber
Instrument Systems GmbH

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