High-speed, voltage-controlled laser beam scanner with novel optical phenomenon using KTN crystal
AMS Technologies presents new spectrometer using a combination of a KTa1-xNbxO3 (KTN) optical beam scanner and a wavelength dispersion element
(PresseBox) (Martinsried, )The new spectrometer is using a combination of a KTa1-xNbxO3 (KTN) optical beam scanner and a wavelength dispersion element. This spectrometer can measure a wide optical spectrum in microsecond-order time because of the fast scan response of KTN optical beam scanner. The spectrometer will be used to measure microsecond optical pulses. The KTN scanner is expected to observe ultrafast luminous phenomena.
The KTN scanner is "all solid state", "opto-electric" without any moving parts. This scanner can steer a light beam in two-dimensional direction for both continuous and step scanning modes by controlling voltage. The operation wavelength is in the 532 - 4000 nm range. The scanner chip is composed of a small KTN crystal chip with electrodes. This makes it possible to reduce the device volume by 1/100 compared to moving mirrors such as polygon mirrors and galvanic mirrors.
This scanner can steer a light beam in tow-dimensional direction for both continuous and step scanning modes by controlling voltage.
Expected Application Fields:
- Imaging in Bio Medical Fields i.e. Microscope, OCT light source
- Sensing in Environment Fields i.e. Gas sensor, LIDAR
- Machining in Industrial Fields i.e. Laser marker, Laser Processing
Learn what will be important for your optical applications at the OPTATEC booth of AMS Technologies, 22-25 May Frankfurt Germany, Hall 3.0 Booth D22. OPTATEC is the International Trade Fair for Future Optical Technologies, Components, Systems and Manufacturing. Please visit our web page for more information www.amstechnologies.com
AMS Technologies AG Fraunhoferstrasse 22 D-82152Martinsried